Conventional Sample preparation tools required to prepare specimens used for Electron Microscopy from bulk materials. Read More
Conventional Sample preparation tools required to prepare specimens used for Electron Microscopy from bulk materials. Read More
A range of sophisticated Ion Beam Sample preparation tools to prepare specimens for Electron Microscopy with outstanding results. Read More
Quorum’s market-leading cryo sem preparation system is the latest in cryo-SEM technology and combines the highest quality results with unparalleled ease of use. It is a highly automated, column-mounted, gas-cooled cryo sem preparation and cryo transfer system suitable for most makes and models of W-SEM, FE-SEM and FIB/SEM.
Cryo preparation techniques for cryo SEM and FIB/SEM are essential for the observation of biological, wet or beam sensitive specimens. Using cryo sem electron microscopy removes the need for conventional preparation methods, such as chemical fixation and critical point drying, and allows observation of specimens in their natural hydrated state.
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Quorum make a range of critical point dryers to meet the needs of electron microscopy (EM) and other applications.
Critical point drying (sometimes called supercritical drying) is an established method of dehydrating biological tissue prior to examination in a scanning electron microscope (SEM).
Quorum also offer two EM freeze dryers, specifically designed for the careful drying of a range of electron microscopy samples.
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Quorum manufacture the market-leading Q Series of sputter coaters and carbon coaters. The advanced Q150 and Q300 models are used in EM laboratories around the world – and increasingly for many thin film coating applications.
Thermal evaporation under high vacuum is an established method of depositing thin layers of metals and carbon. Typical applications include the production of support films and specimen replicas for transmission electron microscopy (TEM) and many thin-film applications.
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Highly efficient anti-contamination tools for better imaging in Transmission and Scanning Electron Microscopes. Read More
