Desktop Imaging

Phenom  Table Top Scanning Electron Microscope (SEM) is based on the 5th generation Phenom desktop SEM platform and is a high-performance SEM for imaging and analysis. With the Phenom desktop SEM, sample structures can be physically examined and their elemental composition determined. Besides point analysis, the optional Elemental Mapping and Line Scan software allows further analysis of the distribution of elements. Read More

Application Notes

Scanning Electron Microscope

Thermo Fisher Scientific Scanning Electron Microscopes cover all the topographical applications for bio and nano technology characterization. These microscopes combine a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. Flexibility of different accessories like EDS, WDS, Heating, Cooling, in-situ applications further expand their capabilities. Read More

Plasma Focused Ion Beam

The Helios G4 PFIB CXe DualBeam™ System provides unique capabilities to enable advanced failure analysis of 3D packages and damage-free delayering of semiconductor devices, in addition to a wide range of other large area FIB processing applications.Read More

Dual Beam

Thermo Fisher Dual Beam Focused Ion Beam-Scanning Electron Microscope systems (FIB-SEMs) provide for site-specific material removal, with the SEM then providing non-destructive imaging of the exposed sub-surface features. Our FIB-SEMs are capable of producing ultra-thin samples for S/TEM and creating fully functional nanoscale prototype devices. Read More

Transmission Electron Microscope

Transmission Electron Microscopes (TEMs) fire a beam of electrons through an ultra-thin sample specimen. The electrons interact with the sample as they pass through it, producing information about the internal structure of the sample. Many of the TEMs manufactured by Thermo Fisher Scientific feature fully automated operation and are capable of sub-Ångström resolution. Read More

Atomic Force Microscope

Park Systems’ comprehensive line of AFMs offers users unparalleled accuracy and ease of use. With AFMs designed specifically to be used in materials science, electronics, life science, nanotechnology, and other areas of research and industry, Park’s tools are trusted to deliver ultra-high resolution with extremely precise measurements quickly and easily.

The Park AFM features the World’s only True non-contact mode that prolongs tip life while preserving the sample, and flexure based independent XY and Z scanner for unparalleled accuracy and resolution. Read More

Application Notes

Scanning Ion Conductance Microscope

The Park NX10 Scanning Ion Conductance Microscopy (SICM) module allows researchers to acquire accurate measurements of samples in aqueous environments. Electrochemistry studies using SICM can now pair their investigations of the mechanisms of redox reactions and other phenomena in chemistry with the ability to map their sample’s topography. Read More

AFM Software

Park SmartScan is a revolutionary operating software for Park AFMs that lets even inexperienced, untrained users produce high quality nanoscale imaging through three simple clicks of a mouse in auto mode, which rivals that made by experts using conventional techniques. SmartScan manual mode also provides all of the functions and tools necessary for more seasoned users to feel at home. This combination of extreme versatility, ease-of-use, and quality makes SmartScan the best AFM operating software available. Read More


VistaScope combines AFM with IR (AFM-IR) spectroscopy to provide IR spectral imaging with unprecedented sub-10 nm spatial resolution. Options are available to combine complementary techniques such as far-field (Raman & Photoluminescence) and near-field photon collection techniques (TERS & sSNOM).

Its patented photo-induced force microscopy (PiFM) measures the near-field optical response of the sample via mechanical force detection, making the technique robust and easy-to-use. Reliable and repeatable PiFM spectrum from 10-nm region provides “nano-FTIR” spectrum in less than a second.

Learn more about Molecular Vista using the link, Read More

Application Notes

Optical Microscope

Olympus offers a range of Optical & Digital microscopes in high quality, easy-to-use, all-in-one imaging systems designed to provide detailed analysis and reports. These microscopes incorporate many complex designs that aim to improve resolution and sample contrast. Olympus microscopes meet a wide-variety of analysis applications, from a routine inspection to sophisticated analysis by its wide range of microscope models strengthened by superb optical performance and a variety of accessories. The combination of digital camera and software provides streamlined workflows and flexible solutions for image acquisition, measurement and reporting as well as grain analysis, particle analysis and other material solutions. Read More

Laser Confocal Microscope

The Olympus laser confocal microscope precisely measures shape and surface roughness at the submicron level. Data acquisition that’s four times faster than previous models delivers a significant boost to productivity. It also offers superb image quality and accurate 3D measurement by non destructive observation method with advanced optical system. Its operation preparation is easy and no pre-process is necessary with your samples. Read More

Microscope Camera & Software

The combination of digital camera and software with the optical microscopes provide streamlined workflows and flexible solutions for image acquisition, measurement and reporting as well as grain analysis, particle analysis and other material solutions.

Read More

Image Analysis

MIPAR is a revolutionary image analysis software that can be used for Partial analysis, Material Science, Earth Science as well as Life science. MIPAR is capable of identifying and measuring features from nearly any image one can capture. Read More

Application Notes

Sample Vitrification

Improve speed and quality in Cryo-TEM sample preparation with Vitrobot

Vitrobot completely automates the vitrification process to provide fast, easy, reproducible sample preparation – the first step in obtaining high quality images and repeatable experimental results. Read More

Specimen Holders

A range of high performance specimen holders for Transmission Electron Microscopy. Read More

Peltier Cooling Stages for SEM

Developed for use in low vacuum and natural SEMs, peltier-cooled stages accurately control dehydration from wet specimens.

The Coolstage is a Peltier-driven SEM cooling stage for scanning electron microscopy (SEM), low vacuum (LV) or variable pressure (VP) applications. The stage can be cooled to sub-zero temperatures for specimens that

may be sensitive at ambient temperature, subject to beam damage, or may otherwise ‘sublime’ (lose water) at ambient temperatures. Read More

Advanced Imaging & Diffraction Tools (NanoMegas) for TEM

NanoMegas novel digital DigiSTAR precision unit in combination with electron diffractometer Pleiades can be adapted to a commercial TEM (100-400 kV old as well as new) and can combine with 3d diffraction tomography to solve nanocrystals structures, otherwise difficult to solve by conventional X-Ray diffraction techniques.

Precision diffraction is also useful to enhance /optimize EELS / EDS spectra and allow to have better data.

We provide installation and service support of NanoMegas products on Thermo Fisher TEM columns. Read More

  • “In Vivo Preclinical Imaging and Drug Discovery” Workshop at ACTREC 26-28 September,2018
  • 8th AFLAS (Asian Federation of Laboratory Animal Science) Nov 28th- Dec 1st ,2018 Bangalore
  • 4th ICCE (International Conference on Emerging Electronics) 16-19th Dec,2018 Bangalore

1) Ceramic Materials Characterization

2) Battery research with a SEM: inspecting one layer at a time

3) Effective asbestos detection with a Scanning Electron Microscope (SEM)

4) How scanning electron microscopy is used for cosmetics research and development

5) Additive manufacturing: improving the quality of AM processes through SEM analysis

1) Scanning Electrochemical Microscopy:

Simultaneous Topographical and Electrochemical Mapping using Scanning Ion Conductance Microscopy – Scanning Electrochemical Microscopy (SICM-SECM)

2) Piezoelectric Force Microscopy:

Piezoelectric Force Microscopy: Multilayered Ceramic Capacitor

3) PinPoint Nanomechanical mode:

PinPoint Nanomechanical Mode Using Probes with Different Stiffness

4) Scanning Kelvin Probe Microscope:

How to obtain sample potential data for SKPM measurement

1) Nanofibers:

Chemical Recognition in Nanofibers Made Possible with hyPIR Imaging

2) Solar Cell:

Nanoscale Chemical Mapping of Perovskite Solar Cell

3) MoS2 Layers:

Nanoscale Identification of MoS2 Layers and Defects

4) Nano Photonics:

Nano Photonics

1) Applications